All-GaN Integrated Overcurrent Protection Circuit Using only Enhancement-mode p-GaN Devices

Nataly Pozo*, Luis Miguel Procel, Lionel Trojman

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

This paper presents the design of a new topology for an Overcurrent Protection (OCP) Integrated Circuit (IC), developed entirely in p-Gallium Nitride (p-GaN) technology using only Enhancement-mode (E-mode) High Electron Transistor Mobility (HEMT) devices. The OCP circuit consists of a current-mirror sensor, a comparator, a latch, and an auxiliary logic circuit. The complexity of this design lies in the absence of P-Type devices. To overcome this limitation, Resistor Transistor Logic (RTL) and Push-Pull buffers are employed. The all-GaN OCP circuit was sized to minimise the OCP response time. The GaN power Integrated Circuit (GaN-IC) includes a 650V/10A HEMT operating at 1 MHz. The OCP performance was tested through pre-and post-layout simulation under load and temperature variations. The response time of the OCP, including parasitic extraction is 34 ns for a current limit of 12 A. The OCP-IC demonstrates a 6% faster response time compared to the state-of-The-Art.

Original languageEnglish
Title of host publicationProceedings - 37th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design, SBCCI 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350391695
DOIs
StatePublished - 2024
Event37th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design, SBCCI 2024 - Joao Pessoa, Brazil
Duration: 2 Sep 20246 Sep 2024

Publication series

NameProceedings - 37th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design, SBCCI 2024

Conference

Conference37th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design, SBCCI 2024
Country/TerritoryBrazil
CityJoao Pessoa
Period2/09/246/09/24

Keywords

  • GaN Comparator
  • GaN-IC
  • GaN-OCP
  • Gallium Nitride
  • Overcurrent Protection Circuit
  • p-GaN HEMT

Fingerprint

Dive into the research topics of 'All-GaN Integrated Overcurrent Protection Circuit Using only Enhancement-mode p-GaN Devices'. Together they form a unique fingerprint.

Cite this