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Model for resistive switching in bipolar Hafnium-based memories

  • Université d'Aix Marseille

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

A new simple model for set-reset operation in resistive random access memories (ReRAM) is presented. In this model, the switching occurs because of changes in a small region of the conductive filament that can be represented by a set of vertical resistors. These resistors can change their conduction mechanism between trap-assisted tunneling (TAT) and ohmic conduction according to the applied external voltage and a switching probability. The model has been calibrated with hafnium-based experimental data, and the results show an excellent agreement between model simulation and experimental response.

Original languageEnglish
Title of host publicationWomen in Physics
Subtitle of host publication6th IUPAP International Conference on Women in Physics
EditorsChandralekha Singh, Geraldine Cochran, Nicola Wilkin
PublisherAmerican Institute of Physics Inc.
ISBN (Electronic)9780735418417
DOIs
StatePublished - 3 Jun 2019
Event6th IUPAP International Conference on Women in Physics, ICWIP 2017 - Birmingham, United Kingdom
Duration: 16 Jul 201720 Jul 2017

Publication series

NameAIP Conference Proceedings
Volume2109
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

Conference6th IUPAP International Conference on Women in Physics, ICWIP 2017
Country/TerritoryUnited Kingdom
CityBirmingham
Period16/07/1720/07/17

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