Skip to main navigation Skip to search Skip to main content

Nonlinear Chemical Processes with Variable Dead Time: Comparative Robustness and Performance Analysis for Model Based Predictive Schemes

  • Maria Gabriela Campoverde
  • , Raisa M. Guayasamin
  • , Oscar Camacho
  • , Paulo Leica
  • Escuela Politecnica Nacional

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The objective of this work is to make a comparison of three predictive control schemes: A Robust Smith Predictor and two kinds of model-based predictive control (MPC) which were applied to a continuous stirred tank reactor (CSTR). This process has an elevated and variable dead time due to the location of the temperature transmitter and the flow variation on which the delay depends. The performance of the controllers is tested under tracking and regulation conditions: change in the set point, persistent disturbance applied at a determined time. In the same way, the proposed control strategies are compared and analized each other using the robustness plot.

Original languageEnglish
Title of host publication2018 IEEE 3rd Ecuador Technical Chapters Meeting, ETCM 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781538666579
DOIs
StatePublished - 17 Dec 2018
Externally publishedYes
Event3rd IEEE Ecuador Technical Chapters Meeting, ETCM 2018 - Cuenca, Ecuador
Duration: 15 Oct 201819 Oct 2018

Publication series

Name2018 IEEE 3rd Ecuador Technical Chapters Meeting, ETCM 2018

Conference

Conference3rd IEEE Ecuador Technical Chapters Meeting, ETCM 2018
Country/TerritoryEcuador
CityCuenca
Period15/10/1819/10/18

Keywords

  • Dead Time
  • Dynamic Matrix Control
  • Generalized Predictive Control
  • Robust Smith Predictor
  • Robustness

Fingerprint

Dive into the research topics of 'Nonlinear Chemical Processes with Variable Dead Time: Comparative Robustness and Performance Analysis for Model Based Predictive Schemes'. Together they form a unique fingerprint.

Cite this