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Ontology-driven Feature Engineering For Machine Learning

  • Universidad San Francisco de Quito

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This study proposes an ontology based feature engineering methodology to enhance the performance and interpretability of machine learning models. By developing an educational ontology structured around a student performance dataset, semantic structures were integrated into the processing pipeline to conceptually group and justify data attributes. Different models were implemented and compared across three tasks: final g rade p rediction, a cademic p erformance classification, and anomaly detection, contrasting traditional approaches with ontology-enhanced versions. While statistical models outperformed the quantitative metrics, the ontology-driven models proved competitive, more structured, and offered greater traceability. This study highlights the potential of ontologies as a complementary tool for machine learning, particularly in contexts where knowledge sustainability is crucial. This project establishes a foundation for further applications in educational domains and other areas involving high semantic complexity.

Original languageEnglish
Title of host publicationETCM 2025 - 9th Ecuador Technical Chapters Meeting
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798331552640
DOIs
StatePublished - 2025
Event9th Ecuador Technical Chapters Meeting, ETCM 2025 - Quito, Ecuador
Duration: 21 Oct 202524 Oct 2025

Publication series

NameETCM 2025 - 9th Ecuador Technical Chapters Meeting

Conference

Conference9th Ecuador Technical Chapters Meeting, ETCM 2025
Country/TerritoryEcuador
CityQuito
Period21/10/2524/10/25

Keywords

  • Ontology
  • anomaly detection
  • classification
  • feature engineering
  • machine learning

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