A compact model based on the Lambert function for AlGaN/GaN Schottky barrier gated-edge termination

Lionel Trojman; Eliana Acurio; Brice De Jaeger; Niels Posthuma; Stefaan Decoutere; Benoit Bakeroot

doi:10.1016/j.sse.2023.108778

A compact model based on the Lambert function for AlGaN/GaN Schottky barrier gated-edge termination

Lionel Trojman, Eliana Acurio, Brice De Jaeger, Niels Posthuma, Stefaan Decoutere, Benoit Bakeroot

Universidad San Francisco de Quito USFQ

Producción científica: Contribución a una revista › Artículo › revisión exhaustiva

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Resumen

A compact model based on the Lambert function is used to describe I-V-T characteristics of Schottky Barrier Diodes (SBDs) with gated-edge termination (GET) with either SiN or SiO/AlO as GET dielectric. Electrical parameters obtained from this model enable Schottky barrier height (SBH) assessment. It will be shown that fluctuations are about 17% in both cases. Similar interface state density (from ideality factor) is obtained which is consistent with previous work and validates this approach as an interesting method to model these GET-SBDs.

Idioma original	Inglés
Número de artículo	108778
Publicación	Solid-State Electronics
Volumen	210
DOI	https://doi.org/10.1016/j.sse.2023.108778
Estado	Publicada - dic. 2023

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title = "A compact model based on the Lambert function for AlGaN/GaN Schottky barrier gated-edge termination",

abstract = "A compact model based on the Lambert function is used to describe I-V-T characteristics of Schottky Barrier Diodes (SBDs) with gated-edge termination (GET) with either SiN or SiO/AlO as GET dielectric. Electrical parameters obtained from this model enable Schottky barrier height (SBH) assessment. It will be shown that fluctuations are about 17% in both cases. Similar interface state density (from ideality factor) is obtained which is consistent with previous work and validates this approach as an interesting method to model these GET-SBDs.",

keywords = "AlGaN barrier, Compact model, Gated-Edge Termination, Lambert Function, Schottky Barrier Diode",

author = "Lionel Trojman and Eliana Acurio and {De Jaeger}, Brice and Niels Posthuma and Stefaan Decoutere and Benoit Bakeroot",

note = "Publisher Copyright: {\textcopyright} 2023 Elsevier Ltd",

year = "2023",

month = dec,

doi = "10.1016/j.sse.2023.108778",

language = "Ingl{\'e}s",

volume = "210",

journal = "Solid-State Electronics",

issn = "0038-1101",

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TY - JOUR

T1 - A compact model based on the Lambert function for AlGaN/GaN Schottky barrier gated-edge termination

AU - Trojman, Lionel

AU - Acurio, Eliana

AU - De Jaeger, Brice

AU - Posthuma, Niels

AU - Decoutere, Stefaan

AU - Bakeroot, Benoit

PY - 2023/12

Y1 - 2023/12

N2 - A compact model based on the Lambert function is used to describe I-V-T characteristics of Schottky Barrier Diodes (SBDs) with gated-edge termination (GET) with either SiN or SiO/AlO as GET dielectric. Electrical parameters obtained from this model enable Schottky barrier height (SBH) assessment. It will be shown that fluctuations are about 17% in both cases. Similar interface state density (from ideality factor) is obtained which is consistent with previous work and validates this approach as an interesting method to model these GET-SBDs.

AB - A compact model based on the Lambert function is used to describe I-V-T characteristics of Schottky Barrier Diodes (SBDs) with gated-edge termination (GET) with either SiN or SiO/AlO as GET dielectric. Electrical parameters obtained from this model enable Schottky barrier height (SBH) assessment. It will be shown that fluctuations are about 17% in both cases. Similar interface state density (from ideality factor) is obtained which is consistent with previous work and validates this approach as an interesting method to model these GET-SBDs.

KW - AlGaN barrier

KW - Compact model

KW - Gated-Edge Termination

KW - Lambert Function

KW - Schottky Barrier Diode

UR - http://www.scopus.com/inward/record.url?scp=85173609488&partnerID=8YFLogxK

U2 - 10.1016/j.sse.2023.108778

DO - 10.1016/j.sse.2023.108778

M3 - Artículo

AN - SCOPUS:85173609488

SN - 0038-1101

VL - 210

JO - Solid-State Electronics

JF - Solid-State Electronics

M1 - 108778

ER -

A compact model based on the Lambert function for AlGaN/GaN Schottky barrier gated-edge termination

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