Model for resistive switching in bipolar Hafnium-based memories

Silvana Guitarra, Laurent Raymond, Lionel Trojman

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Resumen

A new simple model for set-reset operation in resistive random access memories (ReRAM) is presented. In this model, the switching occurs because of changes in a small region of the conductive filament that can be represented by a set of vertical resistors. These resistors can change their conduction mechanism between trap-assisted tunneling (TAT) and ohmic conduction according to the applied external voltage and a switching probability. The model has been calibrated with hafnium-based experimental data, and the results show an excellent agreement between model simulation and experimental response.

Idioma originalInglés
Título de la publicación alojadaWomen in Physics
Subtítulo de la publicación alojada6th IUPAP International Conference on Women in Physics
EditoresChandralekha Singh, Geraldine Cochran, Nicola Wilkin
EditorialAmerican Institute of Physics Inc.
ISBN (versión digital)9780735418417
DOI
EstadoPublicada - 3 jun. 2019
Evento6th IUPAP International Conference on Women in Physics, ICWIP 2017 - Birmingham, Reino Unido
Duración: 16 jul. 201720 jul. 2017

Serie de la publicación

NombreAIP Conference Proceedings
Volumen2109
ISSN (versión impresa)0094-243X
ISSN (versión digital)1551-7616

Conferencia

Conferencia6th IUPAP International Conference on Women in Physics, ICWIP 2017
País/TerritorioReino Unido
CiudadBirmingham
Período16/07/1720/07/17

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