TY - GEN
T1 - Nonlinear Chemical Processes with Variable Dead Time
T2 - 3rd IEEE Ecuador Technical Chapters Meeting, ETCM 2018
AU - Campoverde, Maria Gabriela
AU - Guayasamin, Raisa M.
AU - Camacho, Oscar
AU - Leica, Paulo
N1 - Publisher Copyright:
© 2018 IEEE.
PY - 2018/12/17
Y1 - 2018/12/17
N2 - The objective of this work is to make a comparison of three predictive control schemes: A Robust Smith Predictor and two kinds of model-based predictive control (MPC) which were applied to a continuous stirred tank reactor (CSTR). This process has an elevated and variable dead time due to the location of the temperature transmitter and the flow variation on which the delay depends. The performance of the controllers is tested under tracking and regulation conditions: change in the set point, persistent disturbance applied at a determined time. In the same way, the proposed control strategies are compared and analized each other using the robustness plot.
AB - The objective of this work is to make a comparison of three predictive control schemes: A Robust Smith Predictor and two kinds of model-based predictive control (MPC) which were applied to a continuous stirred tank reactor (CSTR). This process has an elevated and variable dead time due to the location of the temperature transmitter and the flow variation on which the delay depends. The performance of the controllers is tested under tracking and regulation conditions: change in the set point, persistent disturbance applied at a determined time. In the same way, the proposed control strategies are compared and analized each other using the robustness plot.
KW - Dead Time
KW - Dynamic Matrix Control
KW - Generalized Predictive Control
KW - Robust Smith Predictor
KW - Robustness
UR - http://www.scopus.com/inward/record.url?scp=85060731836&partnerID=8YFLogxK
U2 - 10.1109/ETCM.2018.8580271
DO - 10.1109/ETCM.2018.8580271
M3 - Contribución a la conferencia
AN - SCOPUS:85060731836
T3 - 2018 IEEE 3rd Ecuador Technical Chapters Meeting, ETCM 2018
BT - 2018 IEEE 3rd Ecuador Technical Chapters Meeting, ETCM 2018
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 15 October 2018 through 19 October 2018
ER -