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Ontology-driven Feature Engineering For Machine Learning

  • Universidad San Francisco de Quito

Producción científica: Capítulo del libro/informe/acta de congresoContribución a la conferenciarevisión exhaustiva

Resumen

This study proposes an ontology based feature engineering methodology to enhance the performance and interpretability of machine learning models. By developing an educational ontology structured around a student performance dataset, semantic structures were integrated into the processing pipeline to conceptually group and justify data attributes. Different models were implemented and compared across three tasks: final g rade p rediction, a cademic p erformance classification, and anomaly detection, contrasting traditional approaches with ontology-enhanced versions. While statistical models outperformed the quantitative metrics, the ontology-driven models proved competitive, more structured, and offered greater traceability. This study highlights the potential of ontologies as a complementary tool for machine learning, particularly in contexts where knowledge sustainability is crucial. This project establishes a foundation for further applications in educational domains and other areas involving high semantic complexity.

Idioma originalInglés
Título de la publicación alojadaETCM 2025 - 9th Ecuador Technical Chapters Meeting
EditorialInstitute of Electrical and Electronics Engineers Inc.
ISBN (versión digital)9798331552640
DOI
EstadoPublicada - 2025
Evento9th Ecuador Technical Chapters Meeting, ETCM 2025 - Quito, Ecuador
Duración: 21 oct 202524 oct 2025

Serie de la publicación

NombreETCM 2025 - 9th Ecuador Technical Chapters Meeting

Conferencia

Conferencia9th Ecuador Technical Chapters Meeting, ETCM 2025
País/TerritorioEcuador
CiudadQuito
Período21/10/2524/10/25

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