Structure and mesoscopic characterization of laser ablated carbon nanoparticles in water by Raman scattering

J. F. Cardenas, T. Cadenbach, Z. B. Zhang, C. Costa-Vera, S. L. Zhang, J. L. Paz

Producción científica: Capítulo del libro/informe/acta de congresoContribución a la conferenciarevisión exhaustiva


Optical coherence tomography (OCT) is one of the most advanced optical measurement techniques for complex structure visualization. The advantages of OCT have been used for surface and subsurface defect detection in composite materials, polymers, ceramics, non-metallic protective coatings, and many more. Our research activity has been focused on timefrequency spectroscopic analysis in OCT. It is based on time resolved spectral analysis of the backscattered optical signal delivered by the OCT. The time-frequency method gives spectral characteristic of optical radiation backscattered or backreflected from the particular points inside the tested device. This provides more information about the sample, which are useful for further analysis. Nowadays, the applications of spectroscopic analysis for composite layers characterization or tissue recognition have been reported. During our studies we have found new applications of spectroscopic analysis. We have used this method for thickness estimation of thin films, which are under the resolution of OCT. Also, we have combined the spectroscopic analysis with polarization sensitive OCT (PS-OCT). This approach enables to obtain a multiorder retardation value directly and may become a breakthrough in PS-OCT measurements of highly birefringent media. In this work, we present the time-frequency spectroscopic algorithms and their applications for OCT. Also, the theoretical simulations and measurement validation of this method are shown.

Idioma originalInglés
Título de la publicación alojadaOptical Micro- and Nanometrology VI
EditoresWolfgang Osten, Christophe Gorecki, Anand Krishna Asundi
ISBN (versión digital)9781510601352
EstadoPublicada - 2016
Publicado de forma externa
EventoOptical Micro- and Nanometrology VI - Brussels, Bélgica
Duración: 5 abr. 20167 abr. 2016

Serie de la publicación

NombreProceedings of SPIE - The International Society for Optical Engineering
ISSN (versión impresa)0277-786X
ISSN (versión digital)1996-756X


ConferenciaOptical Micro- and Nanometrology VI


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